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~isPartOf:"IIR working paper"
~person:"Naito, Yusuke"
~person:"Yamauchi, Isamu"
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Claim length as a value predictor of a patent
Okada, Yoshimi
;
Naito, Yusuke
;
Nagaoka, Sadao
-
2016
-
Revised in May 2016
Persistent link: https://www.econbiz.de/10011554345
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2
An economic analysis of deferred examination system : evidence from policy reforms in Japan
Yamauchi, Isamu
;
Nagaoka, Sadao
-
2014
Persistent link: https://www.econbiz.de/10010430002
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3
Does the outsourcing of prior art search increase the efficiency of patent examination?
Yamauchi, Isamu
;
Nagaoka, Sadao
-
2013
Persistent link: https://www.econbiz.de/10009745331
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