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~isPartOf:"International journal of manufacturing technology and management"
~isPartOf:"International journal of technology management : IJTM"
~person:"Fichera, S."
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International journal of manufacturing technology and management
International journal of technology management : IJTM
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A variable sampling interval S2-EWWA control chart for monitoring the process variance
Castagliola, P.
;
Celano, G.
;
Fichera, S.
;
Giuffrida, F.
- In:
International journal of technology management : IJTM
37
(
2007
)
1/2
,
pp. 125-146
Persistent link: https://www.econbiz.de/10003419580
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