//--> //--> //-->
Toggle navigation
Logout
Change account settings
EN
DE
ES
FR
A-Z
Beta
About EconBiz
News
Thesaurus (STW)
Research Skills
Help
EN
DE
ES
FR
My account
Logout
Change account settings
Login
Publications
Events
Your search terms
Search
Retain my current filters
~language:"eng"
~person:"Naito, Yusuke"
~subject:"Patent examination"
Search options
All Fields
Title
Exact title
Subject
Author
Institution
ISBN/ISSN
Published in...
Publisher
Open Access only
Advanced
Search history
My EconBiz
Favorites
Loans
Reservations
Fines
You are here:
Home
Search: "Nagaoka, Sadao"
Narrow search
Delete all filters
| 3 applied filters
Year of publication
From:
To:
Subject
All
Patent examination
Japan
3
Patent
3
Innovation
2
Patent law
2
Patentrecht
2
Claimlength
1
Erfindung
1
First claim
1
Invention
1
Licence
1
Lizenz
1
Narrowing of patent scope
1
Patent scope
1
Quality of patent
1
Quality of prior art disclosure
1
more ...
less ...
Online availability
All
Free
1
Type of publication
All
Book / Working Paper
1
Type of publication (narrower categories)
All
Arbeitspapier
1
Graue Literatur
1
Non-commercial literature
1
Working Paper
1
Language
All
English
Author
All
Naito, Yusuke
Nagaoka, Sadao
3
Yamauchi, Isamu
2
Okada, Yoshimi
1
Published in...
All
RIETI discussion paper
1
Source
All
ECONIS (ZBW)
1
Showing
1
-
1
of
1
Sort
Relevance
Date (newest first)
Date (oldest first)
1
Contribution of patent examination to making the patent scope consistent with the invention : evidence from Japan
Okada, Yoshimi
;
Naito, Yusuke
;
Nagaoka, Sadao
-
2016
Persistent link: https://www.econbiz.de/10012128961
Saved in:
Results per page
10
25
50
100
250
A service of the
zbw
×
Loading...
//-->