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~person:"Naito, Yusuke"
~isPartOf:"IIR working paper"
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Claim length as a value predictor of a patent
Okada, Yoshimi
;
Naito, Yusuke
;
Nagaoka, Sadao
-
2016
-
Revised in May 2016
Persistent link: https://www.econbiz.de/10011554345
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