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institution:"Technische Universität Dresden / Fakultät Wirtschaftswissenschaften"
~subject:"Risikomaß"
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Huschens, Stefan
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Kurz-Kim, Jeong-Ryeol
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Technische Universität Dresden / Fakultät Wirtschaftswissenschaften
National Bureau of Economic Research
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Technische Universität Chemnitz
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Dresdner Beiträge zu quantitativen Verfahren
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Value-at-Risk-Schlaglichter : Ausgabe 2/1998
Huschens, Stefan
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1998
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2. Ausg
Persistent link: https://www.econbiz.de/10000996150
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2
Measuring risk in value-at-risk based on student's t-distribution
Huschens, Stefan
;
Kurz-Kim, Jeong-Ryeol
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1998
Persistent link: https://www.econbiz.de/10001422900
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3
Measuring risk in value-at-risk in the presence of infinite variance
Huschens, Stefan
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1998
Persistent link: https://www.econbiz.de/10013440918
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