A class of rank-based tests for doubly-truncated data
Year of publication: |
2013
|
---|---|
Authors: | Shen, Pao-Sheng |
Published in: |
TEST: An Official Journal of the Spanish Society of Statistics and Operations Research. - Springer. - Vol. 22.2013, 1, p. 83-102
|
Publisher: |
Springer |
Subject: | Retrospective sampling | Doubly-truncated | Semiparametric model | Two-sample tests |
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