A new property of Stein procedure in measurement error model
Stein-rule procedure is a known technique for yielding biased but efficient estimators of parameters. This article demonstrates that it can be utilized for overcoming the inconsistency of least squares estimators in measurement error models and therefrom providing a class of consistent estimators.
Year of publication: |
1997
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Authors: | Srivastava, Anil K. ; Shalabh |
Published in: |
Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 32.1997, 3, p. 231-234
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Publisher: |
Elsevier |
Subject: | Inconsistency Measurement errors Stein procedure |
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