A Novel Approach to Optimal Accelerated Life Test Planning With Interval Censoring
| Year of publication: |
2013
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|---|---|
| Authors: | Yang, T ; Pan, R |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 62.2013, 2, p. 527-536
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