An empirical process to derive OSS defect estimation models
Year of publication: |
2011
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Authors: | Xu, Jie ; Capretz, Luiz Fernando ; Ho, Danny |
Published in: |
The international journal of management science and information technology : IJMSIT ; an official publication of the North American Institute of Science and Information Technology. - Toronto : NAISIT Publ., ISSN 1923-0273, ZDB-ID 2769259-0. - 2011, 1, p. 1-26
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Subject: | software quality | quality estimation | software metrics | regression | neurazl networks | fuzzy logic | Software | Fuzzy-Set-Theorie | Fuzzy sets | Qualitätsmanagement | Quality management | Regressionsanalyse | Regression analysis | Schätztheorie | Estimation theory | Softwareentwicklung | Software development | Produktqualität | Product quality | Softwareindustrie | Software industry | Schätzung | Estimation |
Extent: | graph. Darst. |
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Type of publication: | Article |
Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
Language: | English |
Notes: | Systemvoraussetzung: Acrobat Reader |
Other identifiers: | hdl:10419/97886 [Handle] |
Source: | ECONIS - Online Catalogue of the ZBW |
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