An expert system framework for a CIM based quality inspection system
| Year of publication: |
1995
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|---|---|
| Authors: | Hooks, Kevin ; Rabelo, Luis ; Velasco, Tomas |
| Published in: |
Computers & industrial engineering : CAIE ; an internat. journal. - Amsterdam [u.a.] : Elsevier, ISSN 0360-8352, ZDB-ID 1969936. - Vol. 29.1995, 1-4, p. 159-164
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