Can behavioral biometrics make everyone happy?
Jayson Killoran, Yuanyuan (Gina) Cui, Andrew Park, Patrick van Esch, Jan Kietzmann
| Year of publication: |
2023
|
|---|---|
| Authors: | Killoran, Jayson ; Cui, Yuanyuan ; Park, Andrew ; Van Esch, Patrick ; Kietzmann, Jan |
| Published in: |
Business horizons. - Amsterdam : Elsevier, ISSN 0007-6813, ZDB-ID 222663-7. - Vol. 66.2023, 5, p. 585-591
|
| Subject: | Behavioral biometrics | Data privacy | Performance improvement | Worker surveillance | Workplace safety | Datenschutz | Data protection | Biometrie | Biometrics | Zufriedenheit | Satisfaction | Sicherheitstechnik | Safety engineering | Arbeitsschutz | Occupational safety |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.bushor.2023.02.001 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10014382981