Circuits - Fault Tolerance Techniques for High Capacity RAM
| Year of publication: |
2006
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|---|---|
| Authors: | Lu, S.-K. ; Hsu, C.-H. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 2, p. 293-306
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