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Computational resiliency

Year of publication:
2002
Authors: Lee, J. ; Chapin, S.J. ; Taylor, S.
Published in:
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 18.2002, 3, p. 185-200
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Type of publication: Article
Source:
OLC-SSG Economic Sciences
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