Delay-time modelling of a critical system subject to random inspections
Year of publication: |
2019
|
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Authors: | Scarf, P. A. ; Cavalcante, C. A. V. ; Lopes, R. S. |
Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 243003-4. - Vol. 278.2019, 3 (1.11.), p. 772-782
|
Subject: | Maintenance | Reliability | Random inspection | Production | Quality | Theorie | Theory | Produktqualität | Product quality | Instandhaltung | Maintenance policy | Qualitätsmanagement | Quality management | Stochastischer Prozess | Stochastic process |
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