Development of an optimal measuring device selection system using neural networks
| Year of publication: |
2003
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|---|---|
| Authors: | Son, S. ; Park, H. ; Lee, K.H. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 41.2003, 17, p. 4133-4152
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