Early detection of valuable patents using a deep learning model : case of semiconductor industry
Park Chung, So Young Sohn
| Year of publication: |
2020
|
|---|---|
| Authors: | Chung, Park ; Sohn, So Young |
| Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 280700-2. - Vol. 158.2020, p. 1-9
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| Subject: | Patent evaluation | Multimodal Learning | Natural Language Processing | Bidirectional long short-term memory | Convolution neural network | Patent | Neuronale Netze | Neural networks | Halbleiterindustrie | Semiconductor industry | Lernprozess | Learning process | Theorie | Theory | Künstliche Intelligenz | Artificial intelligence |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.techfore.2020.120146 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012518381