Efficient rank tests for semiparametric competing risk models
Year of publication: |
2004
|
---|---|
Authors: | Beyersmann, Jan ; Janssen, Arnold ; Mayer, Claus-Dieter |
Published in: |
Metrika. - Springer. - Vol. 60.2004, 1, p. 73-91
|
Publisher: |
Springer |
Subject: | Semiparametric competing risk model | Rank tests | Likelihood ratio type tests | Asymptotic efficiency |
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