Employing box-and-whisker plots for learning more knowledge in TFT-LCD pilot runs
Year of publication: |
2012
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Authors: | Li, Der-Chiang ; Chen, Chien-Chih ; Chang, Che-Jung ; Chen, Wen-Chih |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 50.2012, 6 (15.3.), p. 1539-1554
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