Frequency Dependence of Degradation and Breakdown of Thin SiO2 Films
Year of publication: |
1995
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Authors: | Nafria, M. ; Yelamos, D. ; Suñe, J. ; Aymerich, X. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 11.1995, 4, p. 257-262
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