How to measure patent thickets – a novel approach

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.

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Year of publication:	2009-06-15
Authors:	Graevenitz, Georg von ; Wagner, Stefan ; Harhoff, Dietmar
Institutions:	Volkswirtschaftliche Fakultät, Ludwig-Maximilians-Universität München
Subject:	patenting \| patent thickets \| patent portfolio races \| complexity

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Extent:	application/pdf
Series:	Discussion Papers in Business Administration.
Type of publication:	Book / Working Paper
Language:	English
Classification:	L13 - Oligopoly and Other Imperfect Markets ; L20 - Firm Objectives, Organization, and Behavior. General ; O34 - Intellectual Property Rights: National and International Issues
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10004967070