Impact of test effort in software development life cycle for effective defect management
V. Suma; T. R. Gopalakrishnan Nair
| Year of publication: |
2014
|
|---|---|
| Authors: | Suma, V. ; Nair, T. R. Gopalakrishnan |
| Published in: |
International journal of productivity and quality management : IJPQM. - [Olney, Bucks] : Inderscience Enterprises, ISSN 1746-6474, ZDB-ID 2193376-5. - Vol. 13.2014, 3, p. 251-271
|
| Subject: | defect detection and prevention | software process | software quality metrics | software inspection | software testing | Software | Softwareentwicklung | Software development | Qualitätsmanagement | Quality management | Softwareindustrie | Software industry | Produktqualität | Product quality |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010389514