Improvement Detection by Control Charts for High Yield Processes
| Year of publication: |
1993
|
|---|---|
| Authors: | Xie, M. ; Goh, T.N. |
| Published in: |
International Journal of Quality & Reliability Management. - Emerald Group Publishing Limited, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 10.1993, 7
|
| Publisher: |
Emerald Group Publishing Limited |
| Subject: | PROBABILITY | QUALITY | STATISTICAL PROCESS CONTROL | ZERO DEFECTS |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | research-article |
| Language: | English |
| Other identifiers: | 10.1108/02656719310043779 [DOI] |
| Source: | Other ZBW resources |
Persistent link: https://www.econbiz.de/10014800911