Inference on Cpk for autocorrelated data in the presence of random measurement errors
Year of publication: |
2010
|
---|---|
Authors: | Scagliarini, Michele |
Published in: |
Journal of Applied Statistics. - Taylor & Francis Journals, ISSN 0266-4763. - Vol. 37.2010, 1, p. 147-158
|
Publisher: |
Taylor & Francis Journals |
Subject: | process capability indices | gauge measurement errors | autocorrelation | estimator | process specifications |
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