Interpretations of fault identification in multivariate manufacturing processes
Kyu Jong Lee, Ji Hoon Kang, Jae Hong Yu and Seong Bum Kim (School of Industrial Management Engineering, Korea University, Seoul, Republic of Korea)
| Year of publication: |
2015
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|---|---|
| Authors: | Lee, Kyu Jong ; Kang, Ji Hoon ; Yu, Jae Hong ; Kim, Seoung Bum |
| Published in: |
European journal of industrial engineering : EJIE. - Genevè : Inderscience Enterprises Ltd., ISSN 1751-5254, ZDB-ID 2384377-9. - Vol. 9.2015, 3, p. 395-408
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| Subject: | data mining | decision tree | fault identification | statistical process control | SPC | T2 decomposition | TFT-LCD manufacturing process | Statistische Qualitätskontrolle | Statistical quality control | Data Mining | Data mining | Prozessmanagement | Business process management | Entscheidungsbaum | Decision tree | Industrie | Manufacturing industries | Statistische Methode | Statistical method | Produktionssteuerung | Production control |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011509156