K-out-of-n System - Reliability Bounds for Multi-State k-out-of-n Systems
Year of publication: |
2008
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Authors: | Tian, Z. ; Yam, R.C.M. ; Zuo, M.J. ; Huang, H.-Z. |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 57.2008, 1, p. 53-58
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