Knowledge generation and diffusion in science & technology : an empirical study of SiC-MOSFET based on scientific papers and patents
Weiwei Pan, Lirong Jian, Tao Liu
| Year of publication: |
2024
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|---|---|
| Authors: | Pan, Weiwei ; Jian, Lirong ; Liu, Tao |
| Published in: |
Technology analysis & strategic management. - London : Taylor & Francis Group, ISSN 1465-3990, ZDB-ID 1485021-7. - Vol. 36.2024, 7, p. 1587-1603
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| Subject: | Bibliometrics | global main path analysis | knowledge diffusion | SiC-MOSFET | Bibliometrie | Wissenstransfer | Knowledge transfer | Innovationsdiffusion | Innovation diffusion | Patent | Welt | World | Technischer Fortschritt | Technological change | Wissensmanagement | Knowledge management |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/09537325.2022.2106419 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10014574147