Leading indicators for detecting change of technology trends : comparison of patents, papers and newspaper articles in Japan and US
Takeshi Maeno, Yusuke Iwasawa and Yutaka Matsuo
| Year of publication: |
2021
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|---|---|
| Authors: | Maeno, Takeshi ; Iwasawa, Yusuke ; Matsuo Yutaka |
| Published in: |
International journal of innovation and technology management. - Singapore [u.a.] : World Scientific Publishing, ISSN 0219-8770, ZDB-ID 2225555-2. - Vol. 18.2021, 4, p. 2150017-1-2150017-18
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| Subject: | Bibliometrics | change point detection | data mining | patent analysis | sequentially discounting auto regression (SDAR) model learning algorithm | Patent | Japan | Bibliometrie | Data Mining | Data mining | USA | United States | Technischer Fortschritt | Technological change | Regressionsanalyse | Regression analysis |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1142/S0219877021500176 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012643546