Lower confidence bounds for C PU and C PL based on multiple samples with application to production yield assurance
| Year of publication: |
2004
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|---|---|
| Authors: | Pearn, W.L. ; Shu, M.H. ; Hsu, B.M. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 42.2004, 12, p. 2339-2356
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