R&D and operational efficiency in China's innovative high-tech enterprises : empirical analysis with two-stage slack based measure data envelopment analysis and threshold regression
Year of publication: |
2025
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Authors: | Liang, Nannan ; Shi, Yu ; Chen, Yao |
Published in: |
Omega : the international journal of management science. - Oxford [u.a.] : Elsevier, ISSN 1873-5274, ZDB-ID 1491111-5. - Vol. 136.2025, Art.-No. 103342, p. 1-11
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Subject: | Enterprise scale | Government subsidies | R&D efficiency | SBM-DEA | Threshold regression model | China | Data-Envelopment-Analyse | Data envelopment analysis | Regressionsanalyse | Regression analysis | Effizienz | Efficiency | Hochtechnologie | High technology | Technische Effizienz | Technical efficiency | Industrieforschung | Industrial research |
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