Optimized allocation of defect inspection capacity with a dynamic sampling strategy
Gloria Luz Rodriguez-Verjan; Stéphane Dauzère-Pérès; Jacques Pinaton
| Year of publication: |
2015
|
|---|---|
| Authors: | Rodriguez-Verjan, Gloria Luz ; Dauzère-Péres, Stéphane ; Pinaton, Jacques |
| Published in: |
Computers & operations research : and their applications to problems of world concern ; an international journal. - Oxford [u.a.] : Elsevier, ISSN 0305-0548, ZDB-ID 194012-0. - Vol. 53.2015, p. 319-327
|
| Subject: | Semiconductor manufacturing | Linear programming | Capacity planning | Inspections | Wafers at Risk | Kapazitätsplanung | Theorie | Theory | Mathematische Optimierung | Mathematical programming | Halbleiterindustrie | Semiconductor industry | Produktionskapazität | Production capacity | Produktionsplanung | Production planning | Stichprobenerhebung | Sampling |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010493470