Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery
Year of publication: |
November 2016
|
---|---|
Authors: | Rodriguez, Andrew ; Tosyali, Ali ; Kim, Byunghoon ; Choi, Jeongsub ; Lee, Jae-Min ; Coh, Byoung-Youl ; Jeong, Myong K. |
Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 63.2016, 4, p. 426-437
|
Subject: | Attributed graph | co-citation | indirect co-citation | outlier | patent citation network (PCN) | similarity measure | subspace clustering | technology management | technology opportunity | Patent | Bibliometrie | Bibliometrics | Innovationsmanagement | Innovation management | Regionales Cluster | Regional cluster | Clusteranalyse | Cluster analysis | Innovation | Unternehmensnetzwerk | Business network | Wissenstransfer | Knowledge transfer |
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