Patent technometry by mind maps : a study on the recycling of waste electrical and electronic equipment
Celso Arruda Vanderlei, Claudia Kniess, Luc Quoniam
| Alternative title: | Tecnometria em patentes por mapas mentais |
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| Year of publication: |
2020
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| Authors: | Vanderlei, Celso Arruda ; Kniess, Claudia ; Quoniam, Luc |
| Published in: |
International journal of innovation : IJI journal. - São Paulo, SP, Brazil : International Journal of Innovation - IJI, ISSN 2318-9975, ZDB-ID 2896926-1. - Vol. 8.2020, 1, p. 77-100
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| Subject: | Technometry | Patents | Recycling | Waste electrical and electronic equipment | Kreislaufwirtschaft | Patent | Elektronikindustrie | Electronics industry | Elektroindustrie | Electrical industry | Elektronikschrott | Electronic waste | Betriebliche Kreislaufwirtschaft | Reverse logistics | Abfallentsorgung | Waste disposal |
freely available
| Type of publication: | Article |
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| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.5585/iji.v8i1.16480 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012271596