Persistence of Innovation in Dutch Manufacturing: Is it Spurious?
Year of publication: |
2006-02-01
|
---|---|
Authors: | Raymond, Wladimir ; Mohnen, Pierre ; Palm, Franz ; Loeff, Sybrand Schim van der |
Institutions: | Centre Interuniversitaire de Recherche en Analyse des Organisations (CIRANO) |
Subject: | dynamic panel data type 2 tobit | innovation | spurious persistence | modèle tobit de type II dynamique | données de panel | persistence |
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