Probabilistic patents, alternative damage rules, and optimal tariffs
by Apurva Dey, Arun Kumar Kaushik, and Rupayan Pal
| Year of publication: |
2019
|
|---|---|
| Authors: | Dey, Apurva ; Kaushik, Arun Kumar ; Pal, Rupayan |
| Published in: |
Journal of institutional and theoretical economics : JITE. - Tübingen : Mohr Siebeck, ISSN 0932-4569, ZDB-ID 232799-5. - Vol. 176.2020, 2, p. 276-311
|
| Subject: | probabilistic intellectual property rights | infringement | damage rules | import competition | trade policy | Immaterialgüterrechte | Intellectual property rights | Patent | Theorie | Theory | Außenwirtschaftspolitik | Foreign economic policy | Import | Patentrecht | Patent law | Internationaler Wettbewerb | International competition | WTO-Recht | WTO law |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1628/jite-2020-0001 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012240636