Reliability Model for Polyimide-Metal Interconnect Shorts in GaAs ASICs
Year of publication: |
2004
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Authors: | Strifas, N. ; Yalamanchili, P. ; Christou, A. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 20.2004, 8, p. 747-760
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Saved in:
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