Self-avoiding walks on random networks of resistors and diodes

We study the self-avoiding walks (SAW) on a square lattice whose various degrees of randomness encompasses many different random networks, including the incipient clusters of the directed, mixed and isotropic bond percolation. We apply the position-space renormalization group (PSRG) method and demonstrate that within the framework of this method one is bound to find that the critical exponent v of the mean end-to-end distance of SAW on various two-dimensional random networks should be equal to the critical exponent of SAW on the ordinary square lattice. A detailed analysis of this finding, and similar findings of other authors, lead us to conclude that a debatable opposite finding, which has been predicted on the basis of different approaches, could be attained after a substantial refinement of the method applied.