Semiparametric Analysis of Correlated Recurrent and Terminal Events
| Year of publication: |
2007
|
|---|---|
| Authors: | Ye, Yining ; Kalbfleisch, John D. ; Schaubel, Douglas E. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 63.2007, 1, p. 78-87
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010947894