Strong ties and weak ties of the knowledge spillover network in the semiconductor industry
Chun-Chieh Wang, Hui-Yun Sung, Dar-Zen Chen, Mu-Hsuan Huang
| Year of publication: |
May 2017
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|---|---|
| Authors: | Wang, Chun-Chieh ; Sung, Hui-Yun ; Chen, Dar-Zen ; Huang, Mu-Hsuan |
| Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 280700-2. - Vol. 118.2017, p. 114-127
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| Subject: | Knowledge spillover | Semiconductor industry | R&D cooperation | Patent citation | Strong tie | Weak tie | Wissenstransfer | Knowledge transfer | Halbleiterindustrie | Patent | Spillover-Effekt | Spillover effect | Soziales Netzwerk | Social network | Industrieforschung | Industrial research | Unternehmensnetzwerk | Business network | Halbleiter | Semiconductor |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.techfore.2017.02.011 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011884302