Technology trajectories and the selection of optimal R&D project sequences
Ties van Bommel, Ronald J. Mahieu, and Edwin J. Nijssen
| Year of publication: |
2014
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|---|---|
| Authors: | Bommel, Ties van ; Mahieu, Ronald J. ; Nijssen, E. J. |
| Published in: |
IEEE transactions on engineering management : EM. - New York, NY : IEEE, ISSN 0018-9391, ZDB-ID 160438-7. - Vol. 61.2014, 4, p. 669-680
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| Subject: | Affordable loss | capability | development | interproject learning | managing R&D projects | real options | sensitivity analyses | technology trajectory | Projektmanagement | Project management | Realoptionsansatz | Real options analysis | Theorie | Theory | Innovationsmanagement | Innovation management | Technischer Fortschritt | Technological change | Lernprozess | Learning process |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010461193