Testing coverage based software reliability assessment incorporating efort expenditure and error generation
Sudeep Kumar, Anu G. Aggarwal, Ritu Gupta
| Year of publication: |
2023
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|---|---|
| Authors: | Kumar, Sudeep ; Aggarwal, Anu Gupta ; Gupta, Ritu |
| Published in: |
Opsearch : journal of the Operational Research Society of India. - New Delhi : Springer India, ISSN 0975-0320, ZDB-ID 2516085-0. - Vol. 60.2023, 4, p. 1888-1901
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| Subject: | Non-homogeneous Poisson process | Software reliability growth models | Software reliability | Error generation | Testing efort and testing coverage | Software | Theorie | Theory | Softwareentwicklung | Software development | Qualitätsmanagement | Quality management | Statistischer Test | Statistical test | Produktqualität | Product quality |
Online Resource
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1007/s12597-023-00680-x [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10014444843