Testing process capability based on Cpm in the presence of random measurement errors
Year of publication: |
2005
|
---|---|
Authors: | Pearn, W. L. ; Shu, M. H. ; Hsu, B. M. |
Published in: |
Journal of Applied Statistics. - Taylor & Francis Journals, ISSN 0266-4763. - Vol. 32.2005, 10, p. 1003-1024
|
Publisher: |
Taylor & Francis Journals |
Subject: | Gauge measurement error | lower confidence bound | critical value | process capability analysis |
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