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~person:"Huang, W."
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Huang, W.
Askin, R.G.
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IEEE transactions on reliability : R ; IEEE T R
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Circuit Component Degradation - A Generalized SSI Reliability Model Considering Stochastic Loading and Strength Aging Degradation
Huang, W.
;
Askin, R.G.
- In:
IEEE transactions on reliability : R ; IEEE T R
53
(
2004
)
1
,
pp. 77-82
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