JEYAKUMARAN, N.; NATARAJAN, B.; PRITHIVIKUMARAN, N.; … - In: Surface Review and Letters (SRL) 15 (2008) 06, pp. 897-901
Porous silicon (PS) layers have been prepared from n-type silicon wafers of (100) orientation. SEM, FTIR, and PL have been used to characterize the morphological and optical properties of PS. The influence of varying light illumination in the anodizing solution, on structural and optical...