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  • Search: subject:"Patent invalidation re-examination"
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Year of publication
Subject
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Analysis of Variance (ANOVA) 2 Gaussian radial basis function kernel (RBF) 2 Invention patent 2 Patent invalidation re-examination 2 Support vector machine (SVM) 2 Analysis of variance 1 Artificial intelligence 1 Erfindung 1 Forecasting model 1 Immaterielle Werte 1 Intangible assets 1 Invention 1 Künstliche Intelligenz 1 Mustererkennung 1 Patent 1 Patent law 1 Patentrecht 1 Pattern recognition 1 Prognoseverfahren 1 Theorie 1 Theory 1 Varianzanalyse 1
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Online availability
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Free 2 CC license 1
Type of publication
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Article 2
Type of publication (narrower categories)
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Article in journal 1 Aufsatz in Zeitschrift 1 research-article 1
Language
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English 2
Author
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Che, Hui-Chung 2 Wang, Mei-Hsin 2
Published in...
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Journal of Intellectual Capital 1 Journal of intellectual capital 1
Source
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ECONIS (ZBW) 1 Other ZBW resources 1
Showing 1 - 2 of 2
Cover Image
Intellectual capital forecasting for invention patent through machine learning model
Wang, Mei-Hsin; Che, Hui-Chung - In: Journal of intellectual capital 25 (2024) 7, pp. 129-150
Persistent link: https://www.econbiz.de/10015419528
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Cover Image
Intellectual capital forecasting for invention patent through machine learning model
Wang, Mei-Hsin; Che, Hui-Chung - In: Journal of Intellectual Capital 25 (2024) 7, pp. 129-150
Purpose This research explores support vector machine (SVM) with Gaussian radial basis function kernel (RBF) as the model and Analysis of Variance (ANOVA) for forecasting the invalidation re-examination decisions of China invention patents, it is beneficial to support patent monetization for...
Persistent link: https://www.econbiz.de/10015351105
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