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Evaluation of image registration spatial accuracy using a Bayesian hierarchical model
Liu, Suyu; Yuan, Ying; Castillo, Richard; Guerrero, Thomas - In: Biometrics 70 (2014) 2, pp. 366-377
Persistent link: https://www.econbiz.de/10010947453
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A Bayesian Chi-Squared Goodness-of-Fit Test for Censored Data Models
Cao, Jing; Moosman, Ann; Johnson, Valen E. - In: Biometrics 66 (2010) 2, pp. 426-434
Persistent link: https://www.econbiz.de/10010948126
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Goodness-of-Fit Diagnostics for Bayesian Hierarchical Models
Yuan, Ying; Johnson, Valen E. - In: Biometrics 68 (2012) 1, pp. 156-164
Persistent link: https://www.econbiz.de/10010683957