In this work we propose a method to obtain the MOSFET transistor threshold voltage, which is known to be an essential magnitude from the modeling viewpoint. Generally, there are a large number N of experimental data, and the use of smoothing splines leads to resolution of linear systems of size...

A systematic way of selecting hyperparameters of the prior on the shape parameter of the generalized extreme value distribution (GEVD) is presented. The optimal selection is based on a Monte Carlo simulation in the generalized maximum likelihood estimation (GMLE) framework. A scaled total misfit...