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~isPartOf:"Quality and reliability engineering international"
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A Method for Correlating Field Life Degradation with Reliability Prediction for Electronic Modules
Coit, David W.
;
Evans, John L.
;
Vogt, Nathan T.
; …
- In:
Quality and reliability engineering international
21
(
2005
)
7
,
pp. 715
Persistent link: https://www.econbiz.de/10006361377
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