LEE, D. U.; JUNG, J. H.; KIM, T. W.; LEE, H. S.; PARK, H. L. - In: Surface Review and Letters (SRL) 14 (2007) 04, pp. 755-759
CdTe thin films were grown on GaAs(100) substrates by using molecular beam epitaxy at various temperatures. The results of the X-ray diffraction (XRD) patterns showed that the orientation of the grown CdTe thin films was the (100) orientation. XRD patterns, atomic force microscopy images,...