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Robust Design of a Polysilicon Deposition Process using Split-plot Analysis
Cantell, B.S.; Ramirez, J.G. - In: Quality and reliability engineering international 10 (1994) 2, pp. 123-132
Persistent link: https://www.econbiz.de/10006408756
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Monitoring Clean Room Air Using Cuscore Charts
Ramirez, J.G. - In: Quality and reliability engineering international 14 (1998) 4, pp. 281-290
Persistent link: https://www.econbiz.de/10006392302
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Editorial
Ramirez, J.G. - In: Quality and reliability engineering international 14 (1998) 4, pp. 195-196
Persistent link: https://www.econbiz.de/10006392311
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Process Monitoring in Integrated Circuit Fabrication Using Both Yield and Spatial Statistics
Collica, R.S.; Ramirez, J.G.; Taam, W. - In: Quality and reliability engineering international 12 (1996) 3, pp. 195-202
Persistent link: https://www.econbiz.de/10006397550