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Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands
de Mast, Jeroen; Erdmann, Tashi P; van Wieringen, Wessel N - In: Journal of quality technology : a quarterly journal of … 43 (2011) 2, pp. 99-113
Persistent link: https://www.econbiz.de/10008930619
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Nonrepeatable Gauge R&R Studies Assuming Temporal or Patterned Object Variation
van der Meulen, Frank; de Koning, Henk; de Mast, Jeroen - In: Journal of quality technology : a quarterly journal of … 41 (2009) 4, pp. 426-439
Persistent link: https://www.econbiz.de/10008318674
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Gauge R&R Studies for Destructive Measurements
Mast, Jeroen de; Trip, Albert - In: Journal of quality technology : a quarterly journal of … 37 (2005) 1, pp. 40-49
Persistent link: https://www.econbiz.de/10007778188
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Measurement System Analysis for Categorical Measurements: Agreement and Kappa-Type Indices
Mast, Jeroen de; Wieringen, Wessel N.van - In: Journal of quality technology : a quarterly journal of … 39 (2007) 3, pp. 191-202
Persistent link: https://www.econbiz.de/10007751674
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Exploratory Data Analysis in Quality-Improvement Projects
Mast, Jeroen de; Trip, Albert - In: Journal of quality technology : a quarterly journal of … 39 (2007) 4, pp. 301-311
Persistent link: https://www.econbiz.de/10007869672